КОНТРОЛЕПРИГОДНАЯ СХЕМА МАТРИЧНОГО ДВОИЧНОГО СУММАТОРА В НЕСТАНДАРТНОМ БАЗИСЕ

  • А.И. Тимошкин

Abstract

The most important problem of the problems of technical diagnostics digital systems is the problem of elaboration short fault detection and acceptable functional (exhaustive) tests for digital LSIs (large – scale integration). In the information processing systems LSIs with regular structure (adders, subtractors, array multipliers, array dividers and so on) perform increasable part. It is easier to design testable digital integrated circuits with a regular structure than integrated circuits with an irregular structure. In this work an interesting from the point of view of practice elaboration LSIs and VLSIs (very large – scale integration) testable functional – logical circuit of a matrix homogenous binary adder with a bit-stuck test with a sequence length 3 and with a minimum functional test with a sequence length 8 is proposed.

References

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Published
2020-03-25
Section
Статті